| عکس | شماره قطعه تولیدکننده | موجودی | تعداد | دیتاشیت | سری | بسته / کیس | بسته بندی | وضعیت محصول | نوع منطقی | ولتاژ تغذیه | تعداد بیت ها | دمای عملیاتی | درجه | صلاحیت | نوع نصب | بسته دستگاه تامین کننده | 
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
                 
                 
                
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                    SN74ABT8952DWIC SCAN-TEST-DEV/XCVR 28-SOIC Texas Instruments  |  
                0 | 
                
                     | 
                  
                  
                    
                       دیتاشیت  | 	
                
                74ABT | 28-SOIC (0.295", 7.50mm Width) | Tube | Obsolete | Scan Test Device with Registered Bus Transceiver | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC | 
                 
                 
                
                 | 
				
                    SNJ54AS181BJTARITHMETIC LOGIC UNIT Texas Instruments  |  
                104 | 
                
                     | 
                  
                  
                    
                       دیتاشیت  | 	
                
                * | - | Bulk | Active | - | - | - | - | - | - | - | - | 
| 
                 
                 | 
				
                    SN74BCT8240ADWRIC SCAN TEST DEVICE BUFF 24-SOIC Texas Instruments  |  
                0 | 
                
                     | 
                  
                  
                    
                       دیتاشیت  | 	
                
                74BCT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | - | - | Surface Mount | 24-SOIC | 
                 
                 
                
                 | 
				
                    SN74BCT8240ANTIC SCAN TEST DEVICE BUFF 24-DIP Texas Instruments  |  
                0 | 
                
                     | 
                  
                  
                    
                       دیتاشیت  | 	
                
                74BCT | 24-DIP (0.300", 7.62mm) | Tube | Obsolete | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | - | - | Through Hole | 24-PDIP | 
                 
                 
                
                 | 
				
                    SN74SSTVF16859GRIC REG BUFFER 13-26BIT 64-TSSOP Texas Instruments  |  
                0 | 
                
                     | 
                  
                  
                    
                       دیتاشیت  | 	
                
                74SSTVF | 64-TFSOP (0.240", 6.10mm Width) | Tape & Reel (TR) | Active | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3V ~ 2.7V | 13, 26 | 0°C ~ 70°C | - | - | Surface Mount | 64-TSSOP | 
                 
                 
                
                 | 
				
                    SN74SSTV16859DGGRIC REG BUFFER 13-26BIT 64-TSSOP Texas Instruments  |  
                0 | 
                
                     | 
                  
                  
                    
                       دیتاشیت  | 	
                
                74SSTV | 64-TFSOP (0.240", 6.10mm Width) | Tape & Reel (TR) | Active | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3V ~ 2.7V | 13, 26 | 0°C ~ 70°C | - | - | Surface Mount | 64-TSSOP | 
                 
                 
                
                 | 
				
                    SN74BCT8374ANTIC SCAN TEST DEVICE W/FF 24-DIP Texas Instruments  |  
                0 | 
                
                     | 
                  
                  
                    
                       دیتاشیت  | 	
                
                74BCT | 24-DIP (0.300", 7.62mm) | Tube | Obsolete | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | - | - | Through Hole | 24-PDIP | 
                 
                 
                
                 | 
				
                    SN74ABT8646DWIC SCAN-TEST-DEV/XCVR 28-SOIC Texas Instruments  |  
                0 | 
                
                     | 
                  
                  
                    
                       دیتاشیت  | 	
                
                74ABT | 28-SOIC (0.295", 7.50mm Width) | Bulk | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC | 
                 
                 
                
                 | 
				
                    SN74SSQE32882ZALRIC REGISTERING CLOCK DVR 176-BGA Texas Instruments  |  
                0 | 
                
                     | 
                  
                  
                    
                       دیتاشیت  | 	
                
                - | 176-TFBGA | Tape & Reel (TR) | Not For New Designs | 1:2 Registered Buffer with Parity | 1.425V ~ 1.575V | 28, 56 | 0°C ~ 85°C | - | - | Surface Mount | 176-NFBGA (13.5x8) | 
                 
                 
                
                 | 
				
                    SN74SSTL16857DGGRIC REG BUFFER 14-BIT 48-TSSOP Texas Instruments  |  
                6,000 | 
                
                     | 
                  
                  
                    
                       دیتاشیت  | 	
                
                74SSTL | 48-TFSOP (0.240", 6.10mm Width) | Bulk | Obsolete | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3V ~ 2.7V | 14 | 0°C ~ 70°C | - | - | Surface Mount | 48-TSSOP |